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revisions ltr description date (yr - mo - da) approved a add device type 04 for device class v and radiation hardened requirements. delete cage 64155. ? ro 00- 03- 16 r. monnin b drawing updated to reflect current requirements. - rrp 05 - 01 - 20 r. monnin c update drawing as part of the 5 year review. - jt 12- 10- 01 c. saffle rev sheet rev sheet rev status rev c c c c c c c c c c c c of sheets sheet 1 2 3 4 5 6 7 8 9 10 11 12 pmic n/a prepared by rick officer dla land and maritime columbus, ohio 43218 - 3990 http://www.landandmaritime.dla.mil standard microcircuit drawing this drawing is available for use by all departments and agencies of the department of defense checked by charles e. besore approved by michael a. frye microcircuit, linear, jfet - input, operational amplifier, monolithic silicon drawing approval date 89- 10- 25 amsc n/a revision level c size a cage code 67268 5962- 89543 sheet 1 of 12 dscc form 2233 apr 97 5962- e 483- 12
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 2 dscc form 2234 apr 97 1. scope 1.1 scope . this drawing documents two product assurance class levels consisting of high reliability (device classes q and m) and space application (device class v). a choice of case outlines and lead finishes are available and are reflected in th e part or identif ying number (pin). when available, a choice of radiation hardness assurance (rha) levels is reflected in the pin. 1.2 pin . the pin is as shown in the following examples. for device classes m and q: 5962 - 89543 01 g a federal stock class designator rha designator (see 1.2.1) device type (see 1.2.2) case outline (see 1.2.4) lead finish (see 1.2.5) \ / \ / drawing number for device class v: 5962 r 89543 0 4 v g a federal stock class designator rha designator (see 1.2.1) device type (see 1.2.2) device class designator case outline (see 1.2.4) lead finish (see 1.2.5) \ / (see 1.2.3) \ / drawing number 1.2.1 rha designator . device classes q and v rha marked devices meet the mil - prf - 38535 specified rha levels and are marked with the appropriate rha designator. device class m rha marked devices meet the mil - prf - 38535, appendix a specified rha levels and are marked with the app ropriate rha designator. a dash ( - ) indicates a non- rha device. 1.2.2 device types . the device types identify the circuit function as follows: device type generic number circuit function 01 op -16a jfet - input, operational amplifier 02 op -16b jfet - input, operational amplifier 03 op -16c jfet - input, operational amplifier 04 op -16a jfet - input, operational amplifier with radiation hardened requirements 1.2.3 device class designator . the device class designator is a single letter identifying the product assurance level as listed below. since the device class designator has been added after the original issuance of this drawing, device classes m and q designators will not be included in the pin and will not be marked on the device. device cl ass device requirements documentation m vendor self - certification to the requirements for mil- std - 883 compliant, non- jan class level b microcircuits in accordance with mil - prf - 38535, appendix a q or v certification and qualification to mil - prf -38535
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 3 dscc form 2234 apr 97 1.2.4 case outlines . the case outlines are as designated in mil - std - 1835 and as follows: outline letter descriptive designator terminals package style g macy1 -x8 8 can p gdip1 - t8 or cdip2 -t8 8 dual -in - line 1.2.5 lead finish . the lead finish is as specified in mil - prf - 38535 for device classes q and v or mil- prf -38535, appendix a for device class m. 1.3 absolute maximum ratings . 1 / supply voltage range (v s ): devices 01, 02, and 04: positive supply voltage (v+) ...................................................................... +22 v dc negative supply voltage (v -) ..................................................................... - 22 v dc device 03: positive supply voltage (v+) ...................................................................... +18 v dc negative supply voltage (v -) ..................................................................... - 18 v dc differential input voltage: devices 01, 02, and 04 ................................................................................. 40 v dc device 03 ..................................................................................................... 30 v dc input voltage: devices 01, 02, and 04 ................................................................................. 20 v dc device 03 ..................................................................................................... 16 v dc maximum power dissipation (p d ) ..................................................................... 500 mw 2 / output short circuit duration ............................................................................. indefinite storage temperature range .............................................................................. -65 c to +150 c lead temperature (soldering, 60 seconds) ...................................................... +300c junction temperatu re (t j ) ................................................................................ +150c thermal resistance, junction -to - case ( jc ) ...................................................... see mil- std -1835 thermal resistance, junction -to - ambient ( ja ): case g ......................................................................................................... 150 c/w case p .......................................................................................................... 119 c/w 1.4 recommended operating conditions . supply voltage (v s ) ......................................................................................... 15 v ambient operating temperature (t a ) ................................................................ -55 c to +125 c 1.5 radiation features . maximum total dose available (dose rate = 50 ? 300 rads(si)/s) ............................ 100 k rads 3 / 1 / stresses above the absolute maximum rating may cause permanent damage to the device. extended operation at the maximum levels may degrade performance and affect reliability. 2 / derate linearly 6.7 mw/ c above t a = +75 c for p package; derate linearly 7.1 mw/ c above t a = +80 c for g package. 3 / these parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. radiation end point limits for the noted parameters are guaranteed only for the conditions specified in mil - std - 883, method 1019, condition a.
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 4 dscc form 2234 apr 97 2. applicable documents 2.1 government specification, standards, and handbooks . the following specification, standards, and handbooks form a part of this drawing to the extent specified herein. unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. department of defense specification mil - prf -38535 - integrated circuits, manufacturing, general specification for. department of defense standards mil - std -883 - test method standard microcircuits. mil - std -1835 - interface standard electronic component case outlines. department of defense handbooks mil - hdbk -103 - list of standard microcircuit drawings. mil - hdbk -780 - standard microcircuit drawings. (copies of these documents are available online at https://assist.dla.mil/quicksearch/ or from the standardization document order desk, 700 robbins avenue, building 4d, philadelphia, pa 19111 - 5094.) 2.2 order of precedence . i n the event of a conflict be tween the text of this drawing and the references cited herein, the text of this drawing takes precedence. nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. requirements 3.1 item requirements . the individual item requirements for device classes q and v shall be in accordance with mil - prf - 38535 and as specified herein or as modified in the device manufacturer's quality management (qm) plan. the modification in the qm plan s hall not affect the form, fit, or function as described herein. the individual item requirements for device class m shall be in accordance with mil - prf - 38535, appendix a for non- jan class level b devices and as specified herein. 3.2 design, construction, and physical dimensions . the design, construction, and physical dimensions shall be as specified in mil - prf - 38535 and herein for device classes q and v or mil- prf - 38535, appendix a and herein for device class m. 3.2.1 case outlines . the c ase outlines shall be in accordance with 1.2.4 herein. 3.2.2 terminal connections . the terminal connections s hall be as specified on figure 1 . 3.2. 3 radiation exposure circuit . the radiation exposure circuit s hall be as specified on figure 2 . 3.3 electrical performance characteristics and postirradiation parameter limits . unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table i and shall apply over the full ambie nt operating temperature range. 3.4 electrical test requirements . the electrical test requirements shall be the subgroups specified in table ii a . the electrical tests for each subgroup are defined in table i. 3.5 marking . the part shall be marked w ith the pin listed in 1.2 herein. in addition, the manufacturer's pin may also be marked. for packages where marking of the entire smd pin number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962 - " on the device. for rha product using this option, the rha designator shall still be marked. marking for device classes q and v shall be in accordance with mil - prf - 38535. marking for device class m shall be in accordance with mil - prf - 38535, appendix a. 3.5.1 certification/compliance mark . the certification mark for device classes q and v shall be a "qml" or "q" as required in mil - prf - 38535. the compliance mark for device class m shall be a "c" as required in mil- prf - 38535, appendix a.
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 5 dscc form 2234 apr 97 table i. electrical performance characteristics . test symbol conditions 1 / 2 / 3 / -55c t a +125 c unless otherwise specified group a subgroups device type limits unit min max input offset voltage v os v cm = 0 v 1 01,04 0.5 mv 2,3 0.9 m,d,p,l,r 1 04 2.0 1 02 1.0 2,3 2.0 1 03 3.0 2,3 4.5 input offset voltage 4 / temperature coefficient t c v os -55 c and +125c 2,3 04 5 v/ c input offset voltage 4 / adjust v ioadj + 1,2,3 04 0.5 mv v ioadj - - 0.5 input offset current i os v s = 20 v, v cm = 0 v 5 / 1,3 01,04 10.0 pa 2 4.0 na m,d,p,l,r 1 04 0.3 na 1,3 02 20.0 pa 2 6.0 na 1,3 03 50.0 pa 2 9.0 na input bias current i ib v s = 20 v, v cm = 0 v 5 / 1,3 01,04 50.0 pa 2 5.0 na m,d,p,l,r 1 04 3.0 na 1,3 02 100.0 pa 2 7.5 na 1,3 03 200.0 pa 2 10.0 na see footnotes at end of table.
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 6 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / 2 / 3 / -55c t a +125 c unless otherwise specified group a subgroups device type limits unit min max common - mode 4 / rejection ratio cmrr v cm = ivr = 10.5 v 1 01,02, 04 86 db v cm = ivr = 10.4 v 2,3 85 v cm = ivr = 10.3 v 1 03 82 v cm = ivr = 10.25 v 2,3 80 output voltage swing 4 / v o r l 2 k ? 4 all 11.0 v r l 10 k ? 5,6 12.0 large - signal voltage gain a vo v o = 10 v, r l 2 k ? 4 01,04 100.0 v/mv 5,6 35.0 m,d,p,l,r 4 04 50.0 4 02 75.0 5,6 30.0 4 03 50.0 5,6 25.0 supply current i s v o = 0 v 1 01,02, 04 7.0 ma 2,3 11.0 m,d,p,l,r 1 04 7.0 1 03 8.0 2,3 12.0 power supply rejection ratio psrr v s = 10 v to 18 v 1 01,02 86 db 2,3 85 v s = 10 v to 15 v 1 03 82 2,3 80 see footnotes at end of table.
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 7 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / 2 / 3 / -55c t a +125 c unless otherwise specified group a subgroups device type limits unit min max power supply rejection 4 / ratio psrr+ v+ = +10 v to +18 v, 1 04 86 db v - = - 15 v 2,3 85 psrr - v - = - 10 v to - 18 v, 1 86 v+ = +15 v 2,3 85 output short circuit 4 / current i sc + 1 04 - 42 - 2 ma i sc - 2 42 slew rate 4 / sr avcl = +1 v 7 01,04 18.0 v/ s 8a 10.0 7 02 12.0 8a 7.0 7 03 9.0 8a 5.0 gain bandwidth product 4 / gbw t a = +25 c, f o = 100 khz 7 01,04 5.5 mhz 02 4.0 03 3.0 power dissipation 4 / p d v o = 0 v, t a = +25 c 1 01,02, 04 210 mw 03 240 settling time t s 6 / 9,10 all 4 s 1 / unless otherwise specified v s = 15 v, r s = 50 ? . 2 / devices supplied to this drawing meet all levels m, d, p, l, and r of irradiation however this device is only tested at the r level. pre and post irradiation values are identical unless otherwise specified in table i. when performing post irradiation electrical measurements for any rha level, t a = +25 c. 3 / these parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect. radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in mil - std -883, method 1019. 4 / this parameter not tested post irradiation. 5 / subgroup 3 is guaranteed if not tested. 6 / subgroup 10 is guaranteed if not tested.
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 8 dscc form 2234 apr 97 device types 01, 02, 03, 04 case outlines g and p terminal number terminal symbol 1 bal 2 - in 3 +in 4 v - 5 bal 6 out 7 v+ 8 nc figure 1. terminal connections . figure 2. radiation exposure circuit .
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 9 dscc form 2234 apr 97 3.6 certificate of compliance . for device classes q and v, a certificate of compliance shall be required from a qml - 38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). for device class m, a certifi cate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in mil - hdbk - 103 (see 6.6.2 herein). the certificate of compliance submitted to dla land and maritime - va prior to listing as an approved source of supply for this drawing shall affir m that the manufacturer's product meets, for device classes q and v, the requirements of mil - prf - 38535 and herein or for device class m, the requirements of mil- prf - 38535, appendix a and herein. 3.7 certificate of conformance . a certificate of conformance as required for device classes q and v in mil - prf - 38535 or for device class m in mil - prf - 38535, appendix a shall be provided with each lot of microcircuits delivered to this drawing. 3.8 notification of change for device class m . for device class m, notification to dla land and maritime - va of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 verification and review for device class m . for device class m, dla land and maritime , dla land and maritime 's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. of fshore documentation shall be made available onshore at the option of the r eviewer . 3.10 microcircuit group assignment for device class m . device class m devices covered by this drawing shall be in microcircuit group number 61 (see mil - prf - 38535, appendix a). 4. verification 4.1 sampling and inspection . for device classes q and v, sampling and inspection procedures shall be in accordance with mil - prf - 38535 or as modified in the device manufacturer's quality management (qm) plan. the modification in the qm plan shall not affect the form, fit, or function as describe d herein. for device class m, sampling and inspection procedures shall be in accordance with mil - prf - 38535, appendix a. 4.2 screening . for device classes q and v, screening shall be in accordance with mil - prf - 38535, and shall be conducted on all device s prior to qualification and technology conformance inspection. for device class m, screening shall be in accordance with method 5004 of mil - std - 883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 additional criteria for device class m . a. burn - in test, method 1015 of mil- std -883. (1) test condition a, b, c or d . the test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or ac quiring activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015. (2) t a = +125 c, minimum. b. interim and final electrical test parameters shall be as specified in table ii a herein. 4.2.2 additional criteria for device classes q and v . a. the burn - in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's qm plan in accordance with mil - prf - 38535. the burn- in test circuit shall be maintained under document revision level control of the device manufacturer's technology review board (trb) in accordance with mil - prf - 38535 and shall be made available to the acq uiring or preparing activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of mil - std -883. b. interim and final electrical test param eters shall be as specified in table ii a herein. c. additional screening for device class v beyond the requirements of device class q shall be as specified in mil - prf - 38535, appendix b. 4.3 qualification inspection for device classes q and v . qualification inspection for device classes q and v shall be in accordance with mil - prf - 38535. inspections to be performed shall be those specified in mil- prf - 38535 and herein for groups a, b, c, d, and e inspections (see 4.4.1 through 4.4.4).
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 10 dscc form 2234 apr 97 table iia . electrical test requirements . test requirements subgroups (in accordance with mil - std - 883, method 5005, table i) subgroups (in accordance with mil - prf - 38535, table iii) device class m device class q device class v interim electrical parameters (see 4.2) 1 1 1 final electrical parameters (see 4.2) 1,2,3,4,5,6,8a 1 / 1,2,3,4,5,6, 1 / 8a 1,2,3,4,5,6 1 / 8a group a test requirements (see 4.4) 1,2,3,4,5,6,7,8a, 2 / 9,10 1,2,3,4,5,6, 2 / 7,8a,9,10 1,2,3,4,5,6, 2 / 7,8a,9,10 group c end - point electrical parameters (see 4.4) 1,4 1,4 1,4 3 / group d end - point electrical parameters (see 4.4) 1,4 1,4 1,4 group e end - point electrical parameters (see 4.4) 1,4 1,4 1,4 1 / pda applies to subgroup 1. v os , i os , and deltas excluded from pda. 2 / subgroup 10, if not tested, shall be guaranteed to the limits specified in table i herein. 3 / delta limits as specified in table iib shall be required where specified, and delta limits shall be computed with reference to the previous endpoint electrical parameters. table iib. delta limits at +25 c . test device type delta limits min max v os 04 0.5 mv i ib 45 pa i os 20 pa 4.4 conformance inspection . technology conformance inspection for classes q and v shall be in accordance with mil - prf - 38535 including groups a, b, c, d, and e inspections and as specified. quality conformance inspection for device class m shall be in accordance with mil - prf -3853 5, appendix a and as specified herein. inspections to be performed for device class m shall be those specified in method 5005 of mil - std - 883 and herein for groups a, b, c, d, and e inspections (see 4.4.1 through 4.4.4). 4.4.1 group a inspection . a. te sts shall be as specified in table ii a herein. b. subgroups 8b and 11 in table i, method 5005 of mil - std - 883 shall be omitted. 4.4.2 group c inspection . the group c inspection end - point electrical parameters shall be as specified in table ii a herein.
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 11 dscc form 2234 apr 97 4.4.2.1 additional criteria for device class m . steady - state life test conditions, method 1005 of mil- std -883: a. test condition a, b, c or d . the test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of mil - std -883. b. t a = +125 c, minimum. c. test duration: 1,000 hours, except as permitted by method 1005 of mil - std -883. 4.4.2.2 additional criteria for device classes q and v . the steady - state life test duration, test condition and test temperature, or approved alter natives shall be as specified in the device manufacturer's qm plan in accordance with mil - prf - 38535. the test circuit shall be maintained under document revision level control by the device manufacturer's trb in accordance with mil - prf - 38535 and shall be made available to the acquiring or preparing activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of mil - std -883. 4.4.3 group d i nspection . the group d inspection end - point electrical parameters shall be as specified in table ii a herein. 4.4.4 group e inspection . group e inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. end - point electrical parameters shall be as specified in table ii a herein. b. for device classes q and v, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in mil - prf - 38535 for the rha level being tested . for device class m, the devices shall be subjected to radiation hardness assured tests as specified in mil - prf - 38535, appendix a for the rha level being tested. all device classes must meet the postirradiation end - point electrical parameter limits as d efined in table i at t a = +25 c 5 c, after exposure, to the subgroups specified in table ii a herein. 5. packaging 5.1 packaging requirements . the requirements for packaging shall be in accordance with mil - prf - 38535 for device classes q and v or mi l - prf - 38535, appendix a for device class m. 6. notes 6.1 intended use . microcircuits conforming to this drawing are intended for use for government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 replaceability . microcircuits covered by this drawing will replace the same generic device covered by a contractor - prepared specification or drawing. 6.2 configuration control of smd's . all proposed changes to existing smd's will be coordinated with th e users of record for the individual documents. this coordination will be accomplished using dd form 1692, engineering change proposal. 6.3 record of users . military and industrial users should inform dla land and maritime when a system application req uires configuration control and which smd's are applicable to that system . dla land and maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. users of drawings covering microelec tronic devices (fsc 5962) should contact dla land and maritime - va, telephone (614) 692 - 054 7 . 6.4 comments . comments on this drawing should be di rected to dla land and maritime - va, columbus, ohio 43218 - 3990, or telephone (614) 692 - 054 0 . 6.5 abbreviations, symbols, and definitions . the abbreviations, symbols, and definitions used herein are defined in mil - prf - 38535 and mil- hdbk -1331.
standard microcircuit drawing size a 5962- 89543 dla land and maritime columbus, ohio 43218 - 3990 revision level c sheet 12 dscc form 2234 apr 97 6.6 sources of supply . 6.6.1 sources of supply for device classes q and v . sources of supply for devi ce classes q and v are listed in qml - 38535. the vendors listed in qml - 38535 have submitted a certificate of compliance (see 3.6 herein) to dla land and maritime- va and have agreed to this drawing. 6.6.2 approved sources of supply for device class m . ap proved sources of supply for class m are listed in mil - hdbk - 103. the vendors listed in mil - hdbk - 103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by dla land and maritime -va.
standard microcircuit drawing bulletin date: 12-10-1 approved sources of supply for smd 5962 -89543 are listed below for immediate acquisition information only and shall be added to mil - hdbk - 103 and qml- 38535 during the next revision. mil- hdbk - 103 and qml-38535 will be revised to include the addition or deletion of sources. the vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by dla land and maritime - va. this information bulletin is superseded by the next dated revision of mil - hdbk - 103 and qml-38535. dla land and maritime maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/programs /smcr/ . standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962- 8954301ga 3 / op - 16aj/883 3 / op - 16ah/883 5962- 8954301pa 3 / op - 16az/883 5962- 8954302ga 3 / op - 16bj/883 3 / op - 16bh/883 5962- 8954302pa 3 / op - 16bz/883 5962- 8954303ga 3 / op - 16ch/883 5962- 8954303pa 3 / op - 16cz/883 3 / op - 16cj8/883 5962- 8954304vga 3 / op - 16aj/qmlv 5962- 8954304vpa 3 / op - 16az/qmlv 5962r8954304vga 24355 op - 16aj/qmlr 5962r8954304vpa 24355 op - 16az/qmlr 1 / the lead finish shown for each pin representing a hermetic package is the most readily available from the manufacturer listed for that part. if the desired lead finish is not listed contact the vendor to determine its availability. 2 / caution . do not use this number for item acquisition. items acquired to this number may not satisfy the performance requirements of this drawing. 3 / not available from an approved source of supply . 1 of 2
standard microcircuit drawing bulletin - continued vendor cage vendor name number and address 24355 analog devices route1 industrial park p.o. box 9106 norwood, ma 02062 point of contact: 7910 triad center drive greensboro, nc 27409 - 9605 the information contained herein is disseminated for convenience only and the government assumes no liability whatsoever for any inaccuracies in the information bulletin. 2 of 2

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